chemical and Morphological influence of SALT fog aging on silicon insulators
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This work investigates on morphological and chemical characteristics of the surface of silicon insulators under aging conditions. For this purpose, a 500 hour salt-fog test was carried out on 24 KV insulators according to IEC 61109. FT-IR results showed that the intensity of Si-CH3 bond increased in the aged sample. Scanning Electron Microscopy (SEM) was employed to monitor the morphological characteristics of the insulator after the test. SEM micrographs showed that the roughness of the sample increased under aging conditions. In order to investigate fillers’ concentration of the insulator before and after aging, Scanning Electron Microscopy (SEM) equipped with Energy Dispersive X-ray Attachment (EDAX) was used. The results showed that the ratio of Al/Si of the virgin sample is higher than that of the aged one. It is due to deficiency of Al and Si fillers. Composite insulators have now been used on overhead lines for several years. However, aging of insulator housings induce damages such as losing hydrophobicity . Salt contamination is one of the natural pollutants which strongly affects the electric performance of polymeric composite insulators . Therefore, it is of interest to study the chemical and morphological influence of salt deposits on the surface of insulators.
B.Elmdoust, S. Gharazi1, M. Moghadam, A.Zamani
Niroo Research Institute, Tehran, Iran
Taban Niroo Company, Shiraz, Iran